"Quantification issues in ToF-SSIMS and AFM co-analysis in two-phase systems, exampled by a polymer blend" Gilmore IS, Seah MP, Johnstone JE SURFACE AND INTERFACE ANALYSIS 35 (11): 888-896 NOV 2003.

Description:

Atomic Force Microscopy (AFM) is the only surface analytical technique that has the potential and ability to measure mechanical properties with sub 10 nm resolution.

At National Physical Laboratories (U.K.) researchers are developing a range of methods for analyzing nanomechanical properties of surfaces using AFM. Stiffness and viscous damping of a material can be imaged qualitatively at NPL with the use of force modulation and phase imaging with 2 nm resolution. Adhesion can also be mapped.

Quantitatively Young’s modulus of a polymer blend can be identified using AFM in force spectroscopy mode or combining AFM with a nanoindenting unit.

Above is an AFM force modulation stiffness image of a PVC-Poly(Butadiene) polymer blend, identifying areas of PVC (dark region, low V) and Poly(Butadiene) (light region, high V) with nanometer scale resolution.

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