"Magnetostatic interaction studied by force microscopy in ultrahigh vacuum", A. Wadas, M. Dreyer, M. Löhndorf, R. Wiesendanger, APPLIED PHYSICS A 64, 353 (1997).

Description:

Magnetic force microscopy (MFM) was introduced in 1987 as a new technique for mapping the field distribution on a microscopic scale. The technique relies on the detection of magnetic forces or force gradients exerted on a probing tip while the tip is scanned over the sample surface. From the time of invention of MFM the performance of this technique was tested in applying it to different magnetic materials from hard magnets like FeNdB to soft ones like garnets.  Performing this technique in Ultrahigh Vacuum allows researchers to resolve the domain walls in all kinds of magnetic materials.

Magnetic domain walls on a BaFe₁₂O₁₉ single crystal; the cantilever was coated with a magnetic iron film.

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