www.nanopicoftheday.org
March 25, 2004
Conducting AFM of Nanotube
Source: Michael
Stadermann
with thanks to the
nano
manipulator group at UNC-Chapel Hill,
funded by NSF, NIH, and DOD.
References:
-
Stadermann M,
Grube H, Boland JJ, et al. "Simultaneous atomic force microscopy measurement
of topography and contact resistance of metal films and carbon nanotubes"
REV SCI INSTRUM 74 (8): 3653-3655 AUG 2003
-
Description:
A bent multi-wall nanotube on silicon dioxide. The tube is draped across a gold
electrode (see insert), and was scanned using conductance imaging AFM, a method
that combines force microscopy and contact resistance measurements. The colors
represent conductance data and the height gives topographical data. As the tube
bends it forms buckles. The buckles have a different contact area to the tip
than the rest of the tube and thus show up very nicely in the conductance data.
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