Description:

The precise sectioning and imaging capabilities of FIB milling, combined with its ability to etch complex patterns (including bitmapped images) make focused ion beam microscopes the ideal tool for one-of-a-kind micromachining, or micromachining of a wide variety of materials.  FIB deposition can produce features 200 nm or less in thickness. FIB milling can produce even finer results. This structure required approximately 30 minutes of FIB time to produce.

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