www.nanopicoftheday.org
July 8, 2004
CdSe Nanocrystals
Source: James R.
McBride
References:
"Abberation-Corrected Z-Contrast Scanning Transmission
Electron Micsoscopy of CdSe Nanocrystals" James
R. McBride, Tadd C. Kippeny, Stephen J. Pennycook, and Sandra J. Rosenthal.
Nano Lett.; 2004; 4(7) pp 1279 - 1283
Description:
Aberration-corrected atomic number contrast scanning transmission
electron microscopy (Z-STEM) was used to study CdSe nanocrystals prepared using
different surfactants. With an optimal probe size of 0.8 Å, unprecedentedly
detailed images of the nanocrystal's lattice structure and surface morphology
were obtained. This level of detail is important for the characterization of
nanomaterials because of the high sensitivity of the nanocrystal's properties to
minute changes in structure. As an example of the power of this technique, a
sample of CdSe nanocrystals prepared using trioctylphosphine oxide (TOPO) as the
surfactant was compared to a sample of CdSe prepared using a mixture of TOPO and
hexadecylamine (HDA). Z-STEM reveals striking differences in nanocrystal
morphology as the result of the addition of HDA.
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