Description:

The Nanofactory TEM-STM is a Scanning Tunneling Microscope mounted inside a Transmission Electron Microscope. A very fine etched tungsten tip is used as a nano manipulator and have been moved in contact with an epitaxially grown InAs nanowire. The InAs nanowires are remarably flexible and can be bent more than 90 degrees without breaking. The electrical resistance of the nanowire can be measured by applying a bias between the tip and the sample.

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