Gurevich L, Canali L, Kouwenhoven LP. "Scanning gate spectroscopy on nanoclusters" Applied Physics Letters 76 (3): 384-386 JAN 17 2000.

Description:

Scanning electron microscope picture of a scanning gate probe. One of the tips is the probe for a scanning tunneling microscope. The other tip is a gate which, operating very close to the STM probe, allows sharper spectroscopy of atoms in the sample under scrutiny. The two tips are about 200 nm apart. With scanning probe microscopes structures in the 1 to 10 nm length scale, such as molecules and clusters can be examined and manipulated. These structures are larger than single atoms but too small to contact by direct electrical probes.

 

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