Scanning Electron Microscopy with Polarization Analysis (SEMPA) and its Applications, J. Unguris, Magnetic Imaging and its Applications to Materials 167-303 (2000) (EPG publication number: 719)

Description:

To better study micromagnetic information storage materials, NIST scientists developed scanning electron microscopy with polarization analysis, or SEMPA, to measure and display the spin direction of electrons in magnetic materials. Studies with this tool are helping U.S. industry figure out how to pack more electronic data bits into smaller spaces on computer hard drives and in thin-film, magnetoresistive memories. Several U.S. companies are taking advantage of the opportunity to work with NIST to obtain measurements necessary to develop the next generation of data storage systems.

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