W. Rivera, J. M. Perez, R. S. Ruoff, D. C. Lorents, R. Malhotra, S. Lim, Y. G. Rho, E. G. Jacobs and R. F. Pinizzotto, "Scanning Tunneling Microscopy Current-Voltage Characteristics of Carbon Nanotubes," J. Vac. Sci. Technol. B 13(2), 327 (1995).
 

Description:

Researchers at the University of North Texas are currently investigating the field emission properties of carbon nanotubes and diamond films, and the etching & growth of epitaxial diamond films at the atomic scale. The goal is to develop carbon films for flat panel display applications, and to understand the diamond etching and growth mechanisms at the atomic scale, which are presently unknown.

AFM is one of the tools available to enable us to image structures smaller than the resolution of an optical microscope.  It works by dragging a tip above the surface and mapping the interaction of the scanning tip with the surface, which even allows height to be determined.  Above is a magnified AFM (Atomic Force Microscopy) image of single-walled carbon nanotube (CNT) ropes and bundles. The region corresponds to a 10-15 mm ´ 10-15 mm square. 

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